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The noise performance of a high-speed capacitive-sensor interface based on a relaxation oscillator and a fast counter

机译:基于张弛振荡器和快速计数器的高速电容传感器接口的噪声性能

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摘要

This paper presents the analysis and experimental results on the noise performances of a capacitive-sensor interface. The interface is able to measure low capacitance values in the order of picofarads and is implemented with a simple relaxation oscillator, a fast counter, and a microcontroller. The goal is to find the criteria to implement a low-noise system, so that, even with a short measuring time, low noise can be obtained. Experimental results are performed in order to prove the validity of the theoretical analysis. The achieved resolution, with a measuring time of 20 ms, was better than 14.2 /spl times/ 10/sup -7/ for the measurement of a capacitance value of 2.2 pF.
机译:本文介绍了电容传感器接口噪声性能的分析和实验结果。该接口能够以皮法的数量级测量低电容值,并通过简单的张弛振荡器,快速计数器和微控制器实现。目的是找到实施低噪声系统的标准,以便即使测量时间短,也可以获得低噪声。实验结果证明了理论分析的正确性。测量电容值为2.2 pF时,测量时间为20 ms,所获得的分辨率优于14.2 / spl次/ 10 / sup -7 /。

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